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Deep Multi-view Models for Glitch Classification

Bahaadini, S., N. Rohani, S. Coughlin, M. Zevin, V. Kalogera, and A. K. Katsaggelos, "Deep Multi-view Models for Glitch Classification", 42nd IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP'17), New Orleans, USA, 2017.
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