Deep Multi-view Models for Glitch Classification

TitleDeep Multi-view Models for Glitch Classification
Publication TypeConference Paper
Year of Publication2017
AuthorsBahaadini, S., N. Rohani, S. Coughlin, M. Zevin, V. Kalogera, and A. K. Katsaggelos
Conference Name 42nd IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP'17)
Conference LocationNew Orleans, USA
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